| Materials Diagnostic Laboratory
(objectives)
Acquire the theoretical and experimental skills necessary to analyze the morphological, structural and optical properties of materials and their composition. Acquire skills in writing a scientific report.
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Code
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20410715 |
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Language
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ITA |
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Type of certificate
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Profit certificate
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Credits
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6
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Scientific Disciplinary Sector Code
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FIS/03
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Contact Hours
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32
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Laboratory Hours
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42
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Type of Activity
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Elective activities
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Teacher
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RUOCCO ALESSANDRO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors and at Lasec Laboratory.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Teacher
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OFFI FRANCESCO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Teacher
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TALAMAS SIMOLA ENRICO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Università Roma Tre