Università Roma Tre

• Introduction to metrology: basic definitions;
• Systems of measurement units (international system of measurement units, CGS systems, Gaussian system): definitions, writing rules and conversion methods;
• Elements of inferential statistics: histograms, position parameters, dispersion parameters, shape parameters, empirical law of frequency, law of large numbers, central limit theorem;
• Evaluation of uncertainty in direct measurements: basic definitions, type A and type B uncertainty, sample mean and variance and their distributions, notable distributions (Gaussian, uniform, t-student), expanded uncertainty;
• Statistical tests: chi-square test, mean test;
• Evaluation of uncertainty in indirect measurements: uncertainty propagation rule in indirect measurements (JCM 100:2008), deterministic model of uncertainty and propagation rule in indirect measurements (maximum error).
• Graphing and mathematical methods: graphing, bi/semi-logarithmic graphs, fit procedures, least squares method.
• Real passive components: resistors, capacitors, inductors;
• Analog measuring instruments: static/dynamic metrological characteristics, D'Arsonval ammeter, electrostatic voltmeter, electrodynamic instrument, analog wattmeter, dc insertion errors of voltmeters and ammeters.
• Electrical resistance measurement methods: voltamperometric method, 2/4-point measurements, DC measurement bridges – Wheatstone bridge, van der Pauw method for resistivity measurement.
• Digital measuring instruments: AD converters, digital voltmeters;
• The oscilloscope: analog oscilloscope, digital oscilloscope, sampling methods, aliasing;
• Electrical noise (outline): sources and types of noise, noise reduction techniques.

International vocabulary of metrology – Basic and general concepts and associated terms (VIM – 3rd ed.)
Evaluation of measurement data — Guide to the expression of uncertainty in measurement
The International System of Units – 9th edition – brochure