| CONDENSED MATTER LABORATORY
(objectives)
To acquire skills in the execution and analysis of data from experiments in matter physics
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Code
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20401810 |
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Language
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ITA |
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Type of certificate
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Profit certificate
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Credits
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6
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Scientific Disciplinary Sector Code
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FIS/03
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Contact Hours
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32
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Laboratory Hours
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42
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Type of Activity
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Elective activities
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Teacher
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CAPELLINI GIOVANNI
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Teacher
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RUOCCO ALESSANDRO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Teacher
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OFFI FRANCESCO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Teacher
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TALAMAS SIMOLA ENRICO
(syllabus)
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.
(reference books)
- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
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|
Dates of beginning and end of teaching activities
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From to |
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Delivery mode
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Traditional
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Attendance
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not mandatory
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Evaluation methods
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Oral exam
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Università Roma Tre