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Teacher
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CAPELLINI GIOVANNI
(syllabus)
Eye and perception. History of microscopy.
Light optics. Fundamentals of optical microscopy. Resolution, contrast and magnification. The components of an optical microscope. Image formation. Reflection microscopy. Phase contrast. Bright field and dark field. Polarization.
Principles of operation of scanning electron microscopy (SEM). Components of a SEM. Sample-probe interaction. Detection of secondary and backscattered electrons. Use of the SEM.
Principles of operation and components of a scanning probe microscope (SPM). Tunnel effect microscopy (STM). Atomic force microscopy (AFM). AFM in contact. AFM in no contact. Secondary scanning techniques. Resolution and artifacts.
Introduction to 2D and 3D image analysis, improvement of image quality with and without the use of kernel, segmentation, binarization and quantitative image analysis with open-access software.
(reference books)
Notes based on the slides used during the lectures.
Fundamentals of Light Microscopy and Electronic Imaging. D. B. Murphy , M. W. Davidson. J. Wiley & Sons
Scanning Microscopy for Nanotechnology, W. Zhou and Z. L. Wang. Springer
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Università Roma Tre