Università Roma Tre

In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.

- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT

In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.

- Notes provided by the teacher based on the slides presented during the lectures
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT

see the card of the teacher of the course

si veda la scheda del docente titolare del corso