Università Roma Tre

Historical background of microscopy, concept of resolution and Rayleigh limit, overview of microscopy techniques and use in different research fields.

Fundamentals of optical microscopy, reflection microscopy, metallography, transmission microscopy, use of polarized light.

Operating principles of electron microscopy, SEM, TEM, EDX. Use of SEM: detection of secondary and backscattered electrons, capture and morphometric analysis of images.

Principles of operation and components of a probe scanning microscope, atomic force microscopy in contact, atomic force microscopy in non-contact. Secondary scanning techniques. Resolution and artifacts.

Introduction to 2D and 3D image analysis, improvement of image quality with and without kernel use, segmentation, binarization and quantitative image analysis with open-access software.

notes provided by the professor based on the slides used during the lectures

Provide the theoretical foundations and the experimental practice of microscopic techniques with particular reference to optical, electronic and probe microscopy.

handouts provided in class